Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
EurekAlert!

Expert-guided machine learning breakthrough enhances fault diagnosis in operating particle accelerator superconducting RF cavities

Researchers from the Institute of Modern Physics (CAS-IMP) have introduced an innovative ML model for classifying faults occurring in SRF cavities during accelerator operation. Deployed at the CAFE2 ...
pv magazine International

New deep learning tech for PV inverter fault diagnosis

A team of scientists in the United States has combined both spatial and temporal attention mechanisms to develop a new approach for PV inverter fault detection. Training the new method on a dataset ...
pv magazine International

Machine learning-based fault detection technique for bifacial PV

A research team led by the University of Sharjah in the United Arab Emirates has developed a novel machine learning approach for fault detection in bifacial PV systems. The method combines a ...