Why next-generation avionics validation is becoming a value driver for aircraft leases. Avionics are the nervous system of ...
Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...
A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...
System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...
How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results