Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

SAN JOSE, Calif., Sept. 27, 2023 /PRNewswire/ -- UnitX, a robotics company building next-generation AI vision systems at the forefront of quality and yield management in manufacturing, is proud to ...

Industrial automation is moving beyond rigid rule-based control systems toward environments where machines can interpret ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Teledyne DALSA introduces its Linea ML 8k multispectral CLHS line scan camera for improved defect detectability with a single scan. Teledyne DALSA, a Teledyne Technologies [NYSE:TDY] company, is ...

AI is becoming core infrastructure in manufacturing, accelerating process optimization, reducing waste, and enabling faster, ...

As electric vehicles surge onto our roads and portable devices dominate our daily lives, lithium-ion batteries have become the invisible powerhouses of modern technology. Yet beneath their sleek ...