Modulation bandwidths continue to grow, promising higher data rates yet imposing test difficulties. Most test technologies are still rooted in past, narrowband architectures, which are increasingly ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

Semiconductor data sheets have changed a lot in the last few years, including growing from 10 pages to a hundred. The problem is that data sheets contain almost too much data, and there's not enough ...

As high-speed serial data rates advance beyond 50 Gb/s, conventional logic-emulating non-return-to-zero (NRZ) signaling is being replaced by PAM4, a four-level pulse amplitude-modulation scheme. PAM4 ...

Beaverton, OR. Tektronix today introduced the customizable and fully integrated Keithley 4200A-SCS parameter analyzer, which accelerates semiconductor device, materials, and process insights by ...

The short definition of a parameter sweep is that it's the process of trying different training parameter values in order to find a good set of neural network weight values. One way to think of a ...