AZoM

Environmental Test Conditions and Their Impact on Semiconductor Failure Analysis

Are your environmental test results exposing true device weaknesses, or just reflecting extreme stress conditions?
POWER Magazine

NERC: Accelerated Coal and Nuclear Retirements Pose Limited Reliability Risks

The accelerated retirement of coal-fired and nuclear generation by 2022 could adversely affect reliability in four regions, including in the East and over parts of the central U.S., the North American ...
EDN

Accel-RF system tests reliability of GaN devices

Joining a family of RF reliability test systems is the HiPR-AARTS (High Power RF Automated Accelerated Reliability Test System) from Accel-RF, intended to help manufacturers prove the reliability of ...
Semiconductor Engineering

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap for Zero Defects

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve ...
Electronic Design

Test System Supplier Helps Implement Accelerated Testing

The Direct Customer Advantage Program from QualMark Corp., Denver, Colo., offers on-line access to timely information to support accelerated reliability testing programs. Through the program, ...
UMass Lowell

Development of Accelerated Aging Test Protocol for Environmental

Electrical devices operate under harsh conditions and high temperatures, requiring coatings or hermetically sealed packaging to protect them. Hermetic packaging is not ideal due to their high cost and ...