About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Testing can represent as much as half the cost of semiconductor device manufacture. To reduce that, Mentor Graphics' TestKompress uses a new compression technology that lets designers cut the amount ...

The Demand for Compression Increases in test pattern size reduce the throughput of production testers proportionately and consequently drive up the cost of testing. In fact, the size of test patterns ...