Traditional electronic test methodologies often have combined different items of discrete test equipment to verify product functionality at the design stage with expensive ATE used to support volume ...

Fontana, CA. ECT announced it is leveraging its experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for challenging in-circuit ...

In preparation for testing, typically the upper portion of the test fixture is connected to a load cell in the crosshead of the testing machine, and the lower portion of the fixture is connected to ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

The Iosipescu Shear and the V-Notched Rail Shear test methods are ASTM standards, ASTM D 5379 1 and D 7078 2, respectively. Both are used primarily for in-plane shear testing, but each can be used for ...

I'm excited to tell you about the IEEE Electromagnetic Compatibility Society/Standards Development Committee (EMC/SDCom), which has sponsored a new working group (Project Number P370: Electrical ...