In tests, Gemini 3.5 outpaced GPT-5.1 High and Opus 4.5 on coding tasks, giving you cleaner outputs and fewer fix-it loops.
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Virtual system integration and test using Model-Based Design uncovers errors introduced in the requirements and design phases of embedded system development, well before the physical testing phase. As ...
The Design & Innovation Award (DI.A) is more than just a trophy. It’s the only award backed by real-world product testing.
What are the challenges of incorporating testing and chiplets? What is a typical test configuration for testing chiplets? 1. Keysight’s M800 series bit-error-ratio testers (BERTs) support NRZ and PAM4 ...
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