Science Daily

Purdue Engineers Create Model For Testing Transistor Reliability

Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...
Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Phys.org

Scientists grow atomically thin transistors and circuits

In an advance that helps pave the way for next-generation electronics and computing technologies—and possibly paper-thin gadgets —scientists with the U.S. Department of Energy's Lawrence Berkeley ...
Science Daily

Team reports scalable fabrication of self-aligned graphene transistors, circuits

Researchers previously reported a self-aligned technique for making graphene transistors with unparalleled speed, but scalability was a question. The team now uses a dielectrophoresis assembly ...
Digital Journal

Logic circuits with diamond-based transistors

The newly developed logic circuits are equipped with diamond-based MOSFETs (metal-oxide-semiconductor field-effect-transistors), and they have two different operation modes. The different modes are a ...
Purdue University

Purdue engineers create model for testing transistor reliability

WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...