The software tool uses self-supervised learning to detect long-term defects in solar assets weeks or years before ...
Abstract: Advanced semiconductor packaging requires high-reliability inspection, but 3D X-ray CT analysis is complex. Automating this process using AI is severely hindered by the “data dilemma”: a ...
US researchers say a self-supervised machine-learning tool can identify long-term physical defects in solar assets weeks or years before conventional inspections, potentially reducing operations and ...
Abstract: Depression is a significant mental health problem and presents a challenge for the machine learning field in the detection of this illness. This study explores automated depression ...
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